INTERIOR DISPLACEMENT AND STRAIN-MEASUREMENT USING WHITE-LIGHT SPECKLES

被引：0
|
作者：
CHIANG, FP
ASUNDI, A
机构：
来源：
APPLIED OPTICS | 1980年 / 19卷 / 14期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：A152 / 2256
相关论文
共 50 条
  • [31] Strain Measurement of Micrometre-Sized Structures under Tensile Loading by Using Scanning White-Light Interferometry
    Ito, Takashi
    Mine, Yoji
    Otsu, Masaaki
    Takashima, Kazuki
    MATERIALS TRANSACTIONS, 2016, 57 (08) : 1252 - 1256
  • [32] Measurement of transparent film using vertical scanning white-light interferometry
    Chang, S. P.
    Me, T. B.
    Sun, Y. L.
    4th International Symposium on Instrumentation Science and Technology (ISIST' 2006), 2006, 48 : 1063 - 1067
  • [33] Strain Measurement of Micrometre-Sized Structures under Tensile Loading by Using Scanning White-Light Interferometry
    Ito, Takashi
    Mine, Yoji
    Otsu, Masaaki
    Takashima, Kazuki
    JOURNAL OF THE JAPAN INSTITUTE OF METALS AND MATERIALS, 2016, 80 (01) : 22 - 26
  • [34] Measurement of the refractive index of an optical medium by using a white-light interferometer
    Nahm, KB
    Shin, ES
    Rhee, BK
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1996, 29 (06) : 724 - 727
  • [35] White-light interferometry with high measurement speed
    Pavlicek, Pavel
    Svak, Vojtech
    19TH POLISH-SLOVAK-CZECH OPTICAL CONFERENCE ON WAVE AND QUANTUM ASPECTS OF CONTEMPORARY OPTICS, 2014, 9441
  • [36] Measurement of the influence of dispersion on white-light interferometry
    Pavlicek, P
    Soubusta, J
    APPLIED OPTICS, 2004, 43 (04) : 766 - 770
  • [37] FILM THICKNESS MEASUREMENT WITH WHITE-LIGHT FRINGES
    MOHANTY, PK
    PUNTAMBEKAR, PN
    SEN, D
    OPTICS AND LASER TECHNOLOGY, 1987, 19 (03): : 149 - 152
  • [38] A micro-displacement stage for scanning white-light interferometry
    Dai, Rong
    Xie, Tie-bang
    Chang, Su-ping
    7th International Symposium on Measurement Technology and Intelligent Instruments, 2005, 13 : 94 - 97
  • [39] WHITE-LIGHT SPECKLE METHOD OF EXPERIMENTAL STRAIN ANALYSIS
    CHIANG, FP
    ASUNDI, A
    APPLIED OPTICS, 1979, 18 (04): : 409 - 411
  • [40] WHITE-LIGHT INTERFEROMETRIC MULTIMODE FIBEROPTIC STRAIN SENSOR
    BELLEVILLE, C
    DUPLAIN, G
    OPTICS LETTERS, 1993, 18 (01) : 78 - 80
12345