MICRO-PIXE WITHIN MAGMATIC INCLUSIONS USING GUPIX SOFTWARE

被引：6

作者：

MOSBAH, M

PICCOT, D

CLOCCHIATTI, R

METRICH, N

GOSSET, J

JORON, JL

机构：

[1] Laboratoire Pierre Süe Groupe des Sciences de la Terre, CEA/CNRS, 91191 Gif Sur Yvette Cédex, CE/Saclay

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 82卷 / 01期

关键词：

D O I：

10.1016/0168-583X(93)95093-K

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have specifically developed the micro-PIXE method in order to study trace elements in volcanic glasses and in melt inclusions trapped in minerals. The elements of interest are contained between Sc and Nb, these elements being useful tracers of the lava generation processes. For this purpose, we adopted GUPIX software (Guelph PIXE software package) which seems suitable for analytical problems generally encountered in the geological field. Adaptations were made to the software to suit our specific requirements: measurement of the H factor as a function of X-ray energy for a thick sample, creation of a fitting program for determining the signal modelisation parameters vs X-ray energy. We obtained reliable results, as proved through the utilization of reference materials (Soil7 and SL1) and samples of composition previously measured by another technique. Fe was used as the internal standard. Micro-PIXE was applied to the study of the phenocryst melt inclusions from several geological contexts.

引用

页码：139 / 145

页数：7

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