EXPERIMENTAL PATTERN MINIMIZATION ALGORITHM FOR FAULT-DETECTION IN DIGITAL INTEGRATED-CIRCUITS

被引：0

|

作者：

CONTE, M ^{[1
]}

MAGGI, G ^{[1
]}

SUAREZ, R ^{[1
]}

CANAS, M ^{[1
]}

机构：

[1] INST VENEZOLANO INVEST CIENT,CARACAS,VENEZUELA

来源：

ACTA CIENTIFICA VENEZOLANA | 1977年 / 28卷

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D O I：

暂无

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

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页码：100 / 100

页数：1

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