EXPERIMENTAL PATTERN MINIMIZATION ALGORITHM FOR FAULT-DETECTION IN DIGITAL INTEGRATED-CIRCUITS

被引：0

作者：

CONTE, M ^{[1
]}

MAGGI, G ^{[1
]}

SUAREZ, R ^{[1
]}

CANAS, M ^{[1
]}

机构：

[1] INST VENEZOLANO INVEST CIENT,CARACAS,VENEZUELA

来源：

ACTA CIENTIFICA VENEZOLANA | 1977年 / 28卷

关键词：

D O I：

暂无

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：100 / 100

页数：1

共 50 条

[1] FAULT-DETECTION SYSTEM FOR DIGITAL INTEGRATED-CIRCUITS
BARROETA, JJ
CAMPS, S
SUAREZ, RE
CANAS, MA
AMAYA, RA
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1977, 26 (03) : 246 - 251
[2] A STATIC FAULT-DETECTION SYSTEM FOR DIGITAL INTEGRATED-CIRCUITS
NAGARAJAN, R
LELAY, T
LIN, GM
MICROPROCESSORS AND MICROSYSTEMS, 1995, 19 (01) : 57 - 63
[3] FAULT COVERAGE IN DIGITAL INTEGRATED-CIRCUITS
WADSACK, RL
BELL SYSTEM TECHNICAL JOURNAL, 1978, 57 (05): : 1475 - 1488
[4] FAULT-DETECTION IN SYNDROME TESTING OF DIGITAL CIRCUITS
AHMED, RE
INTERNATIONAL JOURNAL OF ELECTRONICS, 1993, 75 (02) : 345 - 348
[5] FAULT MODELING FOR DIGITAL MOS INTEGRATED-CIRCUITS
HAYES, JP
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1984, 3 (03) : 200 - 208
[6] FAULT-DETECTION AND CLASSIFICATION IN LINEAR INTEGRATED-CIRCUITS - AN APPLICATION OF DISCRIMINATION ANALYSIS AND HYPOTHESIS-TESTING
EPSTEIN, BR
CZIGLER, M
MILLER, SR
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1993, 12 (01) : 102 - 113
[7] FAULT DIAGNOSIS IN DIGITAL DEVICES BASED ON INTEGRATED-CIRCUITS
ORLYUK, MA
SAVCHENKO, YG
AUTOMATION AND REMOTE CONTROL, 1973, 34 (07) : 1179 - 1182
[8] AUTOMATIC DESIGN OF DIGITAL INTEGRATED-CIRCUITS
BONOMO, A
BESTENTE, G
MARZOCCHI, A
AEI AUTOMAZIONE ENERGIA INFORMAZIONE, 1995, 82 (04): : 336 - 343
[9] GAAS IGFET DIGITAL INTEGRATED-CIRCUITS
SCHUERMEYER, FL
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (05) : 541 - 545
[10] EFFECTIVE TESTING OF DIGITAL INTEGRATED-CIRCUITS
PADWICK, GC
SOLID STATE TECHNOLOGY, 1972, 15 (03) : 46 - &

← 1 2 3 4 5 →