BIT ORIENTED OPTICAL STORAGE WITH THIN TELLURIUM-FILMS

被引：44

|

作者：

LOU, DY

BLOM, GM

KENNEY, GC

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1981年 / 18卷 / 01期

关键词：

D O I：

10.1116/1.570707

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：78 / 86

页数：9

相关论文

共 50 条

[41] HALL-MOBILITY OF EVAPORATED TELLURIUM-FILMS
OKUYAMA, K
KUMAGAI, Y
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1973, 12 (12) : 1884 - 1889
[42] INTERNAL-STRESS IN EVAPORATED TELLURIUM-FILMS
OKUYAMA, K
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (06): : 934 - 937
[43] HOPPING TRANSPORT IN EVAPORATED POLYCRYSTALLINE TELLURIUM-FILMS
MANSINGH, A
GARG, AK
[J]. THIN SOLID FILMS, 1985, 131 (1-2) : 41 - 50
[44] THE STABILITY OF THIN TELLURIUM AND TELLURIUM ALLOY-FILMS FOR OPTICAL-DATA STORAGE .2.
LEE, WY
[J]. THIN SOLID FILMS, 1983, 108 (03) : 353 - 363
[45] TEMPERATURE-DEPENDENCE OF ELECTRICAL TRANSPORT MAGNITUDES IN THIN POLYCRYSTAL TELLURIUM-FILMS ON GLASS
ALBERS, C
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1973, 20 (02): : 435 - 445
[46] THE EFFECT OF OVERCOATS ON THE ABLATIVE WRITING CHARACTERISTICS OF TELLURIUM-FILMS
CHEN, M
MARRELLO, V
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (01): : 75 - 77
[47] FILM THICKNESS DEPENDENCE OF MOBILITY IN DEPOSITED TELLURIUM-FILMS
YASUOKA, Y
MIYATA, T
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (07) : 1397 - 1398
[48] THICKNESS DEPENDENCE OF THE THERMOELECTRIC-POWER OF TELLURIUM-FILMS
SHARMA, AK
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 77 (01): : K81 - K85
[49] THERMOELECTRIC PROPERTIES OF VACUUM-DEPOSITED TELLURIUM-FILMS
SHARMA, AK
SINGH, B
[J]. INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1985, 23 (02) : 84 - 86
[50] ELECTRICAL-PROPERTIES OF THERMALLY EVAPORATED TELLURIUM-FILMS
PHAHLE, AM
[J]. THIN SOLID FILMS, 1977, 41 (02) : 235 - 241

← 1 2 3 4 5 →