共 50 条
- [31] USE OF A CHANNELLED IMAGE INTENSIFIER IN FIELD-ION MICROSCOPE JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08): : 731 - +
- [34] Surface Studies of Refractory Metals and Alloys by Using Field-Ion Microscope and Atomic Probe. 1978, 10 (02): : 141 - 154
- [36] DEPENDENCE OF MOLECULAR ION INTENSITY OF BUTYLAMINE ON OVERLAP PRESSURE IN A FIELD-ION SOURCE ZHURNAL ORGANICHESKOI KHIMII, 1973, 9 (08): : 1752 - 1753
- [37] INCREASED IMAGE BRIGHTNESS CAUSED BY FIELD ADSORPTION IN FIELD-ION MICROSCOPY PHYSICAL REVIEW B, 1973, 8 (09): : 4099 - 4104
- [38] MECHANICAL AND ELECTRONIC ASPECTS OF A FIELD-ION SOURCE FOR BEAM APPLICATIONS JOURNAL DE PHYSIQUE, 1986, 47 (C-2): : 167 - 167
- [40] FIELD-ION MICROSCOPY OF BOUNDARY REGION OF ANTIPHASE SURFACE FIZIKA METALLOV I METALLOVEDENIE, 1987, 63 (03): : 547 - 554