REFRACTION CORRECTIONS TO THE DIFFRACTOMETER ANGLES OF CENTERED REFLECTIONS FROM EXTENDED-FACE SINGLE-CRYSTALS

被引：1

作者：

MCINTYRE, GJ ^{[1
]}

机构：

[1] UNIV EDINBURGH,DEPT PHYS,EDINBURGH EH9 3JZ,MIDLOTHIAN,SCOTLAND

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1981年 / 14卷 / AUG期

关键词：

D O I：

10.1107/S0021889881009291

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：247 / 252

页数：6

共 32 条

[21] NUMERICAL-ANALYSES OF DEFORMATION BAND EVOLUTION IN FACE-CENTERED CUBIC SINGLE-CRYSTALS UNDER TENSILE DEFORMATION
OHASHI, T
MATERIALS TRANSACTIONS JIM, 1990, 31 (06): : 456 - 462
[22] COMPARISON OF FEATURES IN THE HOLZ REFLECTIONS FROM GAAS ALAS SUPERLATTICES AND GAALAS SINGLE-CRYSTALS
GONG, H
SCHAPINK, FW
INSTITUTE OF PHYSICS CONFERENCE SERIES, 1990, (98): : 263 - 266
[23] MODELING OF THE DISLOCATION-STRUCTURE EVOLUTION AND THE MICROPLASTIC DEFORMATION DEVELOPMENT IN FACE-CENTERED CUBIC SINGLE-CRYSTALS OF SUBSTITUTION SOLID-SOLUTIONS
KULAGINA, VV
DUDAREV, EF
RUDCHENKO, VV
IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA, 1980, (07): : 93 - 97
[24] EPITAXIAL-GROWTH OF SOME ORGANIC ACCEPTORS FROM THE VAPOR-PHASE ON THE FACE OF SINGLE-CRYSTALS OF ANTHRACENE
MARCINIAK, B
POBLOCKI, J
WACLAWEK, W
THIN SOLID FILMS, 1981, 78 (04) : 365 - 375
[25] THE DEVELOPMENT OF SPUTTER-INDUCED PITS AND PYRAMIDS ON ION BOMBARDED (11 3 1) SURFACES OF FACE-CENTERED CUBIC METAL SINGLE-CRYSTALS
WHITTON, JL
KIRIAKIDIS, G
CARTER, G
LEWIS, GW
NOBES, MJ
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3): : 640 - 644
[26] ON THE MODELING OF NEUTRON-DIFFRACTION REFLECTIONS FROM SMALL SINGLE-CRYSTALS (VOL A49, PG 655, 1993)
MATHIESON, AM
ACTA CRYSTALLOGRAPHICA SECTION A, 1994, 50 : 793 - 793
[27] SEPARATE MEASUREMENTS OF DYNAMICAL AND KINEMATICAL X-RAY DIFFRACTIONS FROM SILICON SINGLE-CRYSTALS CONTAINING LATTICE IMPERFECTIONS BY A TRIPLE-CRYSTAL DIFFRACTOMETER
IIDA, A
KOHRA, K
ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 : S274 - S274
[28] SEPARATE MEASUREMENTS OF DYNAMICAL AND KINEMATICAL X-RAY DIFFRACTIONS FROM PERFECT AND SURFACE-DAMAGED SINGLE-CRYSTALS WITH A TRIPLE-CRYSTAL DIFFRACTOMETER
IIDA, A
KOHRA, K
JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 (05) : 963 - 964
[29] CONVERGENT BEAM ELECTRON-DIFFRACTION STUDY OF EXTENDED DEFECTS IN GALLIUM CHALCOGENIDE SINGLE-CRYSTALS GROWN FROM THE MELT
DEBLASI, C
MANNO, D
RIZZO, A
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1992, 7 (1A) : A122 - A126
[30] KINETIC INVESTIGATIONS WITHIN THE TRANSITION REGION FROM POLYHEDRAL TO SKELETAL GROWTH MODE .1. GROWTH-KINETICS OF THE BASAL FACE OF ZINC SINGLE-CRYSTALS UNDER DIFFUSION CONDITIONS
IWANOV, D
CRYSTAL RESEARCH AND TECHNOLOGY, 1990, 25 (03) : 237 - 244

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