BUILT-IN SELF-DIAGNOSIS FOR REPAIRABLE EMBEDDED RAMS

被引：52

作者：

TREUER, R

AGARWAL, VK

机构：

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1993年 / 10卷 / 02期

关键词：

D O I：

10.1109/54.211525

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This article presents a method of built-in self-diagnosis (BISD) for repairable, embedded static RAMs. The BISD circuit, with self-repair, requires about 5% extra area in a 64-Kbit SRAM. The circuit contains a small reduced-instruction-set processor, which executes diagnosis algorithms stored in a ROM. These algorithms employ hybrid serial/parallel operations when external repair is available or modular operations when self-repair is required.

引用

页码：24 / 33

页数：10

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