共 11 条
- [7] Assessment of the effective carrier lifetime in a SOI p-i-n diode Si modulator using the reverse recovery method SILICON PHOTONICS II, 2007, 6477
- [8] Impact Of Impurities In 4H, 6H and 3C-SiC Substrate On Reverse Recovery Time Of p-n Junction 2017 SEVENTH INTERNATIONAL CONFERENCE ON INFORMATION SCIENCE AND TECHNOLOGY (ICIST2017), 2017, : 299 - 303