SECONDARY-ELECTRON EMISSION FROM POROUS SOLIDS

被引:19
|
作者
MILLET, JM [1 ]
LAFON, JPJ [1 ]
机构
[1] OBSERV PARIS, DASGAL, CNRS, URA D0335, F-92195 MEUDON, FRANCE
来源
PHYSICAL REVIEW A | 1995年 / 52卷 / 01期
关键词
D O I
10.1103/PhysRevA.52.433
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Porous structure can strongly change the electric behavior of material submitted to bombardment by energetic electrons: strong electric fields (108 V/m) can grow within the pores, because of the small sizes of these pores. We give a model of porous material that enables us to emphasize and illustrate the enhancement of the yield of secondary-electron emission (and the broadening in frequency of its profile) in a porous medium, compared to that in bulk material. Here we have considered materials of astrophysical interest [graphite, iron, aluminum (Al2O3), and silica]. The enhancement is characterized by two emission peaks for small energies of the primary electrons and by an increase of the yield roughly by a factor of 4 for large energies (>1 keV). © 1995 The American Physical Society.
引用
下载
收藏
页码:433 / 438
页数:6
相关论文
共 50 条
  • [31] SECONDARY-ELECTRON EMISSION FOR MATERIAL DIAGNOSTICS
    TOMASHPOLSKII, YY
    INDUSTRIAL LABORATORY, 1992, 58 (02): : 146 - 153
  • [32] SECONDARY-ELECTRON EMISSION OF SEMICONDUCTING GLASSES
    DUNN, B
    OOKA, K
    MACKENZIE, JD
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1973, 56 (09) : 494 - 494
  • [33] INTRINSIC NONLINEARITY OF SECONDARY-ELECTRON EMISSION
    ABATE, J
    MANDEL, L
    JOURNAL OF APPLIED PHYSICS, 1973, 44 (05) : 2122 - 2123
  • [34] SECONDARY-ELECTRON EMISSION OF CESIUM IODIDE
    VERMA, RL
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1973, 6 (17) : 2137 - 2141
  • [35] SECONDARY-ELECTRON EMISSION - PROGRESS AND PROSPECTS
    SCHOU, J
    SCANNING MICROSCOPY, 1989, 3 (02) : 429 - 433
  • [36] ANISOTROPY OF TRUE SECONDARY-ELECTRON EMISSION
    GOMOYUNOVA, MV
    FIZIKA TVERDOGO TELA, 1972, 14 (12): : 3498 - 3500
  • [37] CLUSTER INDUCED SECONDARY-ELECTRON EMISSION
    STAUDENMAIER, G
    HOFER, WO
    LIEBL, H
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1976, 21 (1-2): : 103 - 112
  • [38] SECONDARY-ELECTRON EMISSION OF THE TRIGLYCINE SULFATE
    DEVJATKOV, MN
    KTITOROV, VI
    VESTNIK MOSKOVSKOGO UNIVERSITETA SERIYA 3 FIZIKA ASTRONOMIYA, 1980, 21 (04): : 37 - 41
  • [39] SECONDARY-ELECTRON FIELD-EMISSION
    FITTING, HJ
    HECHT, D
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1988, 108 (01): : 265 - 273
  • [40] DIFFRACTION FEATURES IN SECONDARY-ELECTRON EMISSION
    THAPLIYAL, HV
    UNERTL, WN
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02): : 523 - 526