QUANTITATIVE DEPTH PROFILING BY GLOW-DISCHARGE MASS-SPECTROMETRY

被引:15
|
作者
HALL, DJ
SANDERSON, NE
机构
关键词
D O I
10.1002/sia.740110105
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:40 / 44
页数:5
相关论文
共 50 条
  • [41] MICROCHEMICAL DETERMINATION OF PLATINUM AND IRIDIUM BY GLOW-DISCHARGE MASS-SPECTROMETRY
    JAKUBOWSKI, N
    STUEWER, D
    TOELG, G
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1991, 46 (02) : 155 - 163
  • [42] MAGNETIC ENHANCEMENT OF AN IONIZATION SOURCE FOR GLOW-DISCHARGE MASS-SPECTROMETRY
    BENTZ, BL
    HARRISON, WW
    ANALYTICAL CHEMISTRY, 1982, 54 (09) : 1644 - 1646
  • [43] DETERMINATION OF SMALL AMOUNTS OF PT BY GLOW-DISCHARGE MASS-SPECTROMETRY
    JAKUBOWSKI, N
    STUEWER, D
    FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 334 (07): : 680 - 681
  • [44] GLOW-DISCHARGE ATOMIZATION SOURCE FOR RESONANCE IONIZATION MASS-SPECTROMETRY
    SAVICKAS, PJ
    HESS, KR
    MARCUS, RK
    HARRISON, WW
    ANALYTICAL CHEMISTRY, 1984, 56 (04) : 817 - 819
  • [45] GLOW-DISCHARGE MASS-SPECTROMETRY OF SOME ORGANIC-COMPOUNDS
    MASON, R
    MILTON, D
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1989, 91 (02): : 209 - 225
  • [46] ANALYSIS OF TITANIUM-ALLOYS BY GLOW-DISCHARGE MASS-SPECTROMETRY
    ITOH, S
    HIROSE, F
    HASEGAWA, S
    HASEGAWA, R
    JOURNAL OF THE JAPAN INSTITUTE OF METALS, 1993, 57 (10) : 1186 - 1191
  • [47] QUANTITATIVE-ANALYSIS OF C, N, O, P AND S BY GLOW-DISCHARGE MASS-SPECTROMETRY
    CLARK, J
    RONAN, G
    HOODLESS, RC
    FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 334 (07): : 678 - 678
  • [48] Glow-discharge mass spectrometry (GDMS)
    Inokuma, Yasuo
    Endo, Jyo
    Morimoto, Masayuki
    Sumitomo Metals, 1996, 48 (02): : 98 - 102
  • [49] ANALYSIS OF THIN METALLIC-FILMS BY GLOW-DISCHARGE MASS-SPECTROMETRY
    HECQ, M
    HECQ, A
    FONTIGNIES, M
    ANALYTICA CHIMICA ACTA, 1983, 155 (DEC) : 191 - 198
  • [50] IMPROVEMENT OF ION-SOURCE PERFORMANCE IN GLOW-DISCHARGE MASS-SPECTROMETRY
    JAKUBOWSKI, N
    STUEWER, D
    TOELG, G
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1986, 71 (02): : 183 - 197