A CONTRIBUTION TO THE MEASUREMENT OF PERMITTIVITY WITH THE SHORT-CIRCUITED LINE METHOD

被引：1
|
作者：
IGLESIAS, TP
SEOANE, A
RIVAS, J
机构：
[1] UNIV VIGO,ETSIT,DEPT TEORIA SENAL,E-36200 VIGO,SPAIN
[2] UNIV SANTIAGO DE COMPOSTELA,FAC FIS,DEPT FIS APLICADA,SANTIAGO,SPAIN
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1994年 / 43卷 / 01期
关键词：
D O I：
10.1109/19.286347
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The elimination of the ambiguity in the short-circuited line method for determining the dielectric permittivity by measuring the change in the position of the minimum for two similar frequencies is studied.This quantity is used to uniquely determine the coefficients of an algebraic equation with a single physical solution. Ambiguity may or may not be removed depending on the dielectric characteristics of the sample and on the value of the ratio sample thickness/wavelength. The former are not known a priori and the latter is an experimental parameter, which can be varied. The influence of this parameter on the elimination of ambiguity is studied. Finally the analysis is compared to results of measurements on several organic liquids.
引用
收藏
页码：13 / 17
页数：5
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