ALGORITHMS FOR DETECTION OF FAULTS IN LOGIC CIRCUITS

被引：0
|
作者：
BOURICIU.WG
SCHNEIDE.PR
ROTH, JP
TAN, CJ
HSIEH, EP
PUTZOLU, GR
机构：
来源：
COMPUTER | 1971年 / 4卷 / 01期
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中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
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页码：39 / &
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