ATOMIC-SCALE IMAGING OF ANISOTROPIC ORGANIC CONDUCTORS BY SCANNING PROBE TECHNIQUES (STM/AFM)

被引:13
|
作者
BAR, G [1 ]
MAGONOV, SN [1 ]
CANTOW, HJ [1 ]
GMEINER, J [1 ]
SCHWOERER, M [1 ]
机构
[1] UNIV BAYREUTH,BAYREUTHER INST MAKROMOLEK FORSCH,W-8580 BAYREUTH,GERMANY
关键词
D O I
10.1016/0304-3991(92)90336-I
中图分类号
TH742 [显微镜];
学科分类号
摘要
Monocrystals of the charge transfer complex of tetrathiofulvalene with tetracyanoquinodimethane (TTF/TCNQ) and the fluoranthenyl radical cation salt (FA)2PF6 were studied by scanning tunneling Microscopy (STM) and atomic force microscopy (AFM) at ambient conditions. Structures observed at the atomic scale in STM and AFM images agree well with the molecular arrangement of corresponding crystallographic planes. Patterns revealed in STM and AFM images were assigned to TTF and TCNQ stacks of the (001) surface. Comparison of results provides complementary electronic and atomic structure information. Features observed in STM images of different surfaces of (FA)2PF6 Correlate to charge density distribution assigned to fluoranthene molecules of the (011) plane forming stacks in the crystallographic a-direction. Dimerization of (FA) molecules observed in STM images has been found to be more pronounced than expected from X-ray data. Patterns corresponding to PF6- anions were observed only at certain tunneling conditions.
引用
收藏
页码:644 / 652
页数:9
相关论文
共 50 条
  • [41] Is seeing believing? Atomic-scale imaging of surface structures using scanning tunnelling microscopy
    Woodruff, DP
    CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 2003, 7 (01): : 75 - 81
  • [42] Cascaded nanooptics to probe microsecond atomic-scale phenomena
    Kamp, Marlous
    de Nijs, Bart
    Kongsuwan, Nuttawut
    Saba, Matthias
    Chikkaraddy, Rohit
    Readman, Charlie A.
    Deacon, William M.
    Griffiths, Jack
    Barrow, Steven J.
    Ojambati, Oluwafemi S.
    Wright, Demelza
    Huang, Junyang
    Hess, Ortwin
    Scherman, Oren A.
    Baumberg, Jeremy J.
    PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2020, 117 (26) : 14819 - 14826
  • [43] Atomic-scale scanning tunneling microscopy of amorphous surfaces
    Bürgler, DE
    Schmidt, CM
    Schaller, DM
    Meisinger, F
    Schaub, TM
    Baratoff, A
    Güntherodt, HJ
    PHYSICAL REVIEW B, 1999, 59 (16) : 10895 - 10902
  • [44] ATOMIC-SCALE MANIPULATION IN AIR WITH THE SCANNING TUNNELING MICROSCOPE
    GARCIA, RG
    APPLIED PHYSICS LETTERS, 1992, 60 (16) : 1960 - 1962
  • [46] STM AND AFM OF ORGANIC MATERIALS - A CLOSER LOOK ON THE MOLECULAR SCALE
    FROMMER, JE
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1992, 203 : 17 - COLL
  • [47] AFM measurement of atomic-scale Si surface etching by active oxidation
    Morita, Y.
    Migita, S.
    Mizubayashi, W.
    Ota, H.
    SURFACE SCIENCE, 2010, 604 (17-18) : 1432 - 1437
  • [48] Atomic-scale imaging of carbon nanofibre growth
    Helveg, S
    López-Cartes, C
    Sehested, J
    Hansen, PL
    Clausen, BS
    Rostrup-Nielsen, JR
    Abild-Pedersen, F
    Norskov, JK
    NATURE, 2004, 427 (6973) : 426 - 429
  • [49] Direct atomic-scale imaging of ceramic interfaces
    Dickey, EC
    Fan, X
    Pennycock, SJ
    ACTA MATERIALIA, 1999, 47 (15-16) : 4061 - 4068
  • [50] Atomic-scale imaging of ultrafast materials dynamics
    Flannigan, David J.
    Lindenberg, Aaron M.
    MRS BULLETIN, 2018, 43 (07) : 485 - 490