SCANNING TUNNELING MICROSCOPY AT POTENTIAL CONTROLLED ELECTRODE SURFACES IN ELECTROLYTIC ENVIRONMENT

被引：124
|
作者：
LUSTENBERGER, P
ROHRER, H
CHRISTOPH, R
SIEGENTHALER, H
机构：
[1] IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
[2] UNIV BERN,INST ANORGAN ANALYT & PHYS CHEM,CH-3012 BERN,SWITZERLAND
来源：
JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1988年 / 243卷 / 01期
关键词：
D O I：
10.1016/0022-0728(88)85043-5
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：225 / 235
页数：11
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