TRANSIENT ION-SIMULATED IRRADIATION-INDUCED CREEP OF NICKEL

被引：0
|
作者：
MICHEL, DJ
HENDRICK, PL
PIEPER, AG
机构：
[1] USN,RES LAB,WASHINGTON,DC 20375
[2] BATTELLE MEM INST,PACIF NW LABS,RICHLAND,WA 99352
[3] USN,RES LAB,WASHINGTON,DC 20375
来源：
TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY | 1977年 / 26卷
关键词：
D O I：
暂无
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
引用
收藏
页码：195 / 196
页数：2
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