A GUIDE TO SELECTING ELECTRONIC CAMERAS FOR LIGHT MICROSCOPE-BASED IMAGING

被引:0
|
作者
不详
机构
关键词
D O I
暂无
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:25 / +
页数:1
相关论文
共 50 条
  • [31] Atomic force microscope-based dissection of human metaphase chromosomes and high resolutional imaging by carbon nanotube tip
    Iwabuchi, S
    Mori, T
    Ogawa, K
    Sato, K
    Saito, M
    Morita, Y
    Ushiki, T
    Tamiya, E
    ARCHIVES OF HISTOLOGY AND CYTOLOGY, 2002, 65 (05) : 473 - 479
  • [32] Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing
    Landolsi, Fakhreddine
    Ghorbel, Fathi H.
    Dabney, James B.
    JOURNAL OF DYNAMIC SYSTEMS MEASUREMENT AND CONTROL-TRANSACTIONS OF THE ASME, 2013, 135 (01):
  • [33] Micromachined fountain pen for atomic force microscope-based nanopatterning
    Deladi, S
    Tas, NR
    Berenschot, JW
    Krijnen, GJM
    de Boer, MJ
    de Boer, JH
    Peter, M
    Elwenspoek, MC
    APPLIED PHYSICS LETTERS, 2004, 85 (22) : 5361 - 5363
  • [34] A guide to choosing and using scientific imaging cameras
    Fullerton, Stephanie
    LASER FOCUS WORLD, 2014, 50 (02): : 37 - 40
  • [35] A guide to choosing and using scientific imaging cameras
    Fullerton, S. (sfullerton@hamamatsu.com), 1600, PennWell Corporation (50):
  • [37] INVESTIGATION OF EMITTER TIPS FOR SCANNING TUNNELING MICROSCOPE-BASED MICROPROBE SYSTEMS
    STAUFER, U
    MURAY, LP
    KERN, DP
    CHANG, THP
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06): : 2962 - 2966
  • [38] THE DESIGN, PERFORMANCE, AND APPLICATION OF AN ATOMIC-FORCE MICROSCOPE-BASED PROFILOMETER
    MCEACHERN, RL
    MOORE, CE
    WALLACE, RJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1995, 13 (03): : 983 - 989
  • [39] Electronic cameras for low-light microscopy
    Rasnik, Ivan
    French, Todd
    Jacobson, Ken
    Berland, Keith
    DIGITAL MICROSCOPY, 3RD EDITION, 2007, 81 : 219 - 249
  • [40] CYTOPLASMIC TUTOR - A PROGRAM FOR TEACHING INTERPRETATION OF A MICROSCOPE-BASED LABORATORY TEST
    ASTION, ML
    HUTCHINSON, K
    CHING, AKY
    PAGLIARO, LJ
    WENER, MH
    M D COMPUTING, 1994, 11 (05): : 301 - 306