TESTING OF DIGITAL-SYSTEMS

被引:10
|
作者
SIEWIOREK, DP [1 ]
LAI, LKW [1 ]
机构
[1] CARNEGIE MELLON UNIV, DEPT ELECT ENGN, PITTSBURGH, PA 15213 USA
关键词
D O I
10.1109/PROC.1981.12169
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1321 / 1333
页数:13
相关论文
共 50 条
  • [1] TESTING OF DIGITAL-SYSTEMS - AN OVERVIEW
    BRACHO, S
    SOLANA, JM
    VILLAR, E
    [J]. REVISTA DE INFORMATICA Y AUTOMATICA, 1985, (64): : 7 - 24
  • [2] ALGORITHMS FOR FUNCTIONAL TESTING OF DIGITAL-SYSTEMS
    LOMBARDI, F
    WEY, CL
    [J]. INTERNATIONAL JOURNAL OF ELECTRONICS, 1987, 62 (05) : 707 - 732
  • [3] THE PHILOSOPHY OF TESTING DIGITAL-SYSTEMS - A PRAGMATIC APPROACH
    BENNETTS, RG
    [J]. ELECTRONICS AND POWER, 1981, 27 (02): : 162 - 165
  • [4] DIGITAL-SYSTEMS
    不详
    [J]. INSTRUMENTS & CONTROL SYSTEMS, 1980, 53 (07): : 49 - 49
  • [5] DIGITAL-SYSTEMS
    不详
    [J]. INSTRUMENTS & CONTROL SYSTEMS, 1980, 53 (03): : 49 - 49
  • [6] DIGITAL-SYSTEMS - UPDATE
    不详
    [J]. INSTRUMENTS & CONTROL SYSTEMS, 1981, 54 (02): : 65 - 65
  • [7] ICS DIGITAL-SYSTEMS
    不详
    [J]. INSTRUMENTS & CONTROL SYSTEMS, 1981, 54 (07): : 55 - 55
  • [8] DIGITAL-SYSTEMS RELIABILITY
    BOSE, SM
    [J]. ENGINEERING, 1982, 222 (06): : R1 - R4
  • [9] ICS DIGITAL-SYSTEMS
    不详
    [J]. INSTRUMENTS & CONTROL SYSTEMS, 1980, 53 (08): : 53 - 53
  • [10] TESTING FUNCTIONAL FAULTS IN DIGITAL-SYSTEMS DESCRIBED BY REGISTER TRANSFER LANGUAGE
    SU, SYH
    HSIEH, YI
    [J]. JOURNAL OF DIGITAL SYSTEMS, 1982, 6 (2-3): : 161 - 183