THE EFFECTS OF SURFACE-TOPOGRAPHY IN NUCLEAR MICROPROBE RUTHERFORD BACKSCATTERING ANALYSIS

被引：22
|
作者：
HOBBS, CP [1 ]
MCMILLAN, JW [1 ]
PALMER, DW [1 ]
机构：
[1] UNIV SUSSEX,SCH MATH & PHYS SCI,BRIGHTON BN1 9QH,E SUSSEX,ENGLAND
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1988年 / 30卷 / 03期
关键词：
D O I：
10.1016/0168-583X(88)90023-7
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：342 / 348
页数：7
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