EFFECTS OF SURFACE-TOPOGRAPHY ON RHEED PATTERN

被引:0
|
作者
KAKIBAYASHI, H [1 ]
SHIMOTSU, T [1 ]
NAGATA, F [1 ]
机构
[1] HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN
来源
JOURNAL OF ELECTRON MICROSCOPY | 1981年 / 30卷 / 03期
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TH742 [显微镜];
学科分类号
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页码:232 / 232
页数:1
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