Possible routes for cluster growth and particle formation in RF silane discharges

被引:123
|
作者
Perrin, Jerome [1 ]
Boehm, Christian [1 ]
Etemadi, Roxana [1 ]
Lloret, Antoni [1 ]
机构
[1] Ecole Polytech, CNRS, UPR A0258, Phys Interfaces & Couches Minces Lab, F-91128 Palaiseau, France
来源
PLASMA SOURCES SCIENCE & TECHNOLOGY | 1994年 / 3卷 / 03期
关键词
m;
D O I
10.1088/0963-0252/3/3/003
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
After having distinguished five successive steps in the temporal evolution of a powder-forming SiH(4) radiofrequency glow discharge, we examine the Initial mechanism by which silicon clusters start growing up to the point where they suddenly aggregate into multiply charged particles and modify the discharge regime. This 'induction' period can be much longer than the diffusion time of positive ions and neutral radicals, which implies that cluster growth involves negative ions (anions). We provide a review of basic data concerning anions in SiH(4) plasmas and analyse mass spectrometric data showing that anion- molecule reactions Si(n)H(2n+1)(-) + SiH(4) -> S(n+1)H(2n+3)(-) + H(2) at relatively low rate (about 10(-12) cm(3) s(-1)), and fast exothermic anion-radical reactions Si(n)H(m)(-) + SiH(m) -> Si(n+1)H(m+m'-2q)(-) + qH(2) at Langevin rates (about 10(-9) cm(3) s(-1)), initiate clustering. The effective anion lifetime involves a succession of dissociative attachment to SiH(4), detachment or recombination, and attachment to neutral radicals or clusters competing with diffusion out of the plasma. Anion-molecule and anion-radical cluster reactions at Langevin rates probably dominate the cluster growth kinetics below 100 Si atoms whereas anion-neutral and neutral-neutral condensation at size-scaling collision rates govern the subsequent homogenous nucleation regime. At the end of the nucleation period (up to 10(4) Si atoms) the fraction of singly charged clusters can reach 50%. The reduction of powder formation upon gas heating is attributed to a decrease of the rate of nondissociative attachment to radicals and neutral clusters.
引用
收藏
页码:252 / 261
页数:10
相关论文
共 50 条
  • [31] The reliability of measurements on electron energy distribution function in silane rf glow discharges
    Lin, KX
    Lin, XY
    Chi, LF
    Yu, CY
    Yao, RH
    Yu, YP
    CHINESE PHYSICS, 2003, 12 (02): : 198 - 203
  • [32] Optical emission spectroscopy of rf glow discharges of methane-silane mixtures
    Andujar, JL
    Pascual, E
    Viera, G
    Bertran, E
    THIN SOLID FILMS, 1998, 317 (1-2) : 120 - 123
  • [33] MECHANISM OF CLUSTER FORMATION IN A CLEAN SILANE DISCHARGE
    VEPREK, S
    SCHOPPER, K
    AMBACHER, O
    RIEGER, W
    VEPREKHEIJMAN, MGJ
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1993, 140 (07) : 1935 - 1942
  • [35] CLUSTER FORMATION AND GROWTH IN FLOW OF DILUTE PARTICLE SUSPENSION IN MICROCHANNELS
    Gudipaty, Tarun
    Cheung, Luthur S. L.
    Jiang, Linan
    Zohar, Yitshak
    PROCEEDINGS OF THE 9TH BIENNIAL CONFERENCE ON ENGINEERING SYSTEMS DESIGN AND ANALYSIS - 2008, VOL 4, 2009, : 357 - 362
  • [36] Cluster formation and growth in microchannel flow of dilute particle suspensions
    Gudipaty, Tarun
    Stamm, Matthew T.
    Cheung, Luthur S. L.
    Jiang, Linan
    Zohar, Yitshak
    MICROFLUIDICS AND NANOFLUIDICS, 2011, 10 (03) : 661 - 669
  • [37] Cluster formation and growth in microchannel flow of dilute particle suspensions
    Tarun Gudipaty
    Matthew T. Stamm
    Luthur S. L. Cheung
    Linan Jiang
    Yitshak Zohar
    Microfluidics and Nanofluidics, 2011, 10 : 661 - 669
  • [38] Electron temperature and density variation due to temporal evolution of nano particle growth in rf silane plasma
    Chai, K. B.
    Seon, C. R.
    Choe, W.
    Park, S.
    Chung, C. W.
    MULTIFACETS OF DUSTY PLASMA, 2008, 1041 : 175 - +
  • [39] Roles of SiH3 and SiH2 radicals in particle growth in rf silane plasmas
    Kyushu Univ, Fukuoka, Japan
    Jpn J Appl Phys Part 1 Regul Pap Short Note Rev Pap, 7 B (4985-4988):
  • [40] Roles of SiH3 and SiH2 radicals in particle growth in rf silane plasmas
    Kawasaki, H
    Ohkura, H
    Fukuzawa, T
    Shiratani, M
    Watanabe, Y
    Yamamoto, Y
    Suganuma, S
    Hori, M
    Goto, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (7B): : 4985 - 4988