DETERMINATION OF UV-LASER INDUCED SURFACE-STRUCTURES BY ATOMIC FORCE MICROSCOPY

被引：5

作者：

WEFERS, L ^{[1
]}

BOSBACH, D ^{[1
]}

RAMMENSEE, W ^{[1
]}

SCHOLLMEYER, E ^{[1
]}

机构：

[1] UNIV COLOGNE,INST MINERAL PETR,W-5000 COLOGNE 1,GERMANY

来源：

APPLIED SURFACE SCIENCE | 1993年 / 69卷 / 1-4期

关键词：

D O I：

10.1016/0169-4332(93)90545-M

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The changes in surface topography due to UV-laser treatment are of high significance for the determination of material destruction thresholds and for surface reconstruction. A combined arrangement of an UV-laser and an atomic force microscope (AFM) allows for the first time a highly sensitive surface characterisation of the very same area of the irradiated sample between different laser pulses. Irradiation of poly(ethylene terephthalate) (PET) with pulsed UV-laser light of 248 nm, modifies the smooth surface of the polymer into a well-oriented structured surface. The evolution of such structures was studied. A change in surface topography was found in relation to fluence and number of pulses applied. A statistical interpretation of AFM images gives some indications to the mechanism of material processing.

引用

页码：418 / 423

页数：6

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