DETERMINATION OF UV-LASER INDUCED SURFACE-STRUCTURES BY ATOMIC FORCE MICROSCOPY

被引：5
|
作者：
WEFERS, L [1 ]
BOSBACH, D [1 ]
RAMMENSEE, W [1 ]
SCHOLLMEYER, E [1 ]
机构：
[1] UNIV COLOGNE,INST MINERAL PETR,W-5000 COLOGNE 1,GERMANY
来源：
APPLIED SURFACE SCIENCE | 1993年 / 69卷 / 1-4期
关键词：
D O I：
10.1016/0169-4332(93)90545-M
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The changes in surface topography due to UV-laser treatment are of high significance for the determination of material destruction thresholds and for surface reconstruction. A combined arrangement of an UV-laser and an atomic force microscope (AFM) allows for the first time a highly sensitive surface characterisation of the very same area of the irradiated sample between different laser pulses. Irradiation of poly(ethylene terephthalate) (PET) with pulsed UV-laser light of 248 nm, modifies the smooth surface of the polymer into a well-oriented structured surface. The evolution of such structures was studied. A change in surface topography was found in relation to fluence and number of pulses applied. A statistical interpretation of AFM images gives some indications to the mechanism of material processing.
引用
收藏
页码：418 / 423
页数：6
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