SCANNING BEAM LANDING SYSTEM ENDORSED AS GLOBAL STANDARD

被引：0
|
作者：
BEARSE, SV
HERBAUGH, RE
机构：
来源：
MICROWAVES | 1978年 / 17卷 / 05期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：12 / 13
页数：2
相关论文
共 50 条
  • [21] AN ANALYSIS OF THE SCANNING BEAM PIV ILLUMINATION SYSTEM
    GRAY, C
    GREATED, CA
    MCCLUSKEY, DR
    EASSON, WJ
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1991, 2 (08) : 717 - 724
  • [22] Pencil Beam Scanning System Based On A Cyclotron
    Tachikawa, Toshiki
    Nonaka, Hideki
    Kumata, Yukio
    Nishio, Teiji
    Ogino, Takashi
    APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: TWENTY-FIRST INTERNATIONAL CONFERENCE, 2011, 1336 : 410 - 412
  • [23] Beam Control System for Ultrasound Scanning Device
    Denisov, E. S.
    Temyanov, B. K.
    Sagdiev, R. K.
    Fazlyyyakhmatov, M. G.
    INNOVATIVE MECHANICAL ENGINEERING TECHNOLOGIES, EQUIPMENT AND MATERIALS-2013, 2014, 69
  • [24] Beam Scanning System of an Industrial Electron Accelerator
    Borisov, M. A.
    Shvedunov, V. I.
    MOSCOW UNIVERSITY PHYSICS BULLETIN, 2024, 79 (02) : 291 - 300
  • [25] Monte Carlo simulation of a laser beam image in the landing navigation system
    Kablukova, Evgeniya G.
    Prigarin, Sergei M.
    Oshlakov, Victor G.
    26TH INTERNATIONAL SYMPOSIUM ON ATMOSPHERIC AND OCEAN OPTICS, ATMOSPHERIC PHYSICS, 2020, 11560
  • [26] Comprehensive Morning QA System for Proton Beam Scanning System
    Chung, H.
    Langen, K.
    MEDICAL PHYSICS, 2017, 44 (06)
  • [27] A high resolution beam scanning system for deep ion beam lithography
    Sanchez, JL
    van Kan, JA
    Osipowicz, T
    Springham, SV
    Watt, F
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 136 : 385 - 389
  • [28] A Scanning LIDAR System for Active Hazard Detection and Avoidance During Landing on Europa
    Schindhelm, Eric
    Rohrschneider, Reuben
    Roark, Shane
    Weimer, Carl
    2018 IEEE AEROSPACE CONFERENCE, 2018,
  • [29] USE OF UNITED-STATES INTERIM STANDARD MICROWAVE LANDING SYSTEM IN CANADA
    REED, WC
    CANADIAN AERONAUTICS AND SPACE JOURNAL, 1978, 24 (04): : 217 - 227
  • [30] Systematic characterization of integrated circuit standard components as stimulated by scanning laser beam
    Glowacki, Arkadiusz M.
    Brahma, Sanjib Kumar
    Suzuki, Hiroyoshi
    Boit, Christian
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2007, 7 (01) : 31 - 49
12345