A TECHNIQUE FOR COMPARING THE BULK AND SURFACE-STRUCTURE OF DEFECTS IN THIN-FILMS USING THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：12
|
作者：
TREACY, MMJ
KRAKOW, W
SMITH, DA
TRAFAS, G
机构：
来源：
APPLIED PHYSICS LETTERS | 1981年 / 38卷 / 05期
关键词：
D O I：
10.1063/1.92370
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：341 / 343
页数：3
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