A TECHNIQUE FOR COMPARING THE BULK AND SURFACE-STRUCTURE OF DEFECTS IN THIN-FILMS USING THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：12

作者：

TREACY, MMJ

KRAKOW, W

SMITH, DA

TRAFAS, G

机构：

来源：

APPLIED PHYSICS LETTERS | 1981年 / 38卷 / 05期

关键词：

D O I：

10.1063/1.92370

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：341 / 343

页数：3

共 50 条

[1] STUDIES OF THIN-FILMS WITH A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
COWLEY, JM
JOURNAL OF METALS, 1980, 32 (12): : 56 - 56
[2] SCANNING ELECTRON-MICROSCOPE VS TRANSMISSION ELECTRON-MICROSCOPE USING REPLICA TECHNIQUE FOR SURFACE-STRUCTURE STUDY OF POLYMER MATERIALS
KATO, K
JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (01): : 95 - &
[3] MICROANALYSIS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
KOMODA, T
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1979, (APR): : 36 - 36
[4] MICROANALYSIS IN THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
CRAVEN, AJ
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1985, 10 (05): : 353 - 360
[5] MICROANALYSIS IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
MAHER, DM
JOY, DC
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (08) : C387 - C387
[6] REFLECTION IMAGING USING A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
MILNE, RH
HOWIE, A
WALLS, MG
INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 261 - 262
[7] REFLECTION IMAGING USING A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
MILNE, RH
HOWIE, A
WALLS, MG
EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 261 - 262
[8] SCANNING-TRANSMISSION ELECTRON-MICROSCOPE INTRODUCED IN BERLIN
不详
KAUTSCHUK GUMMI KUNSTSTOFFE, 1975, 28 (11): : 660 - 661
[9] MASS MAPPING WITH THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
WALL, JS
HAINFELD, JF
ANNUAL REVIEW OF BIOPHYSICS AND BIOPHYSICAL CHEMISTRY, 1986, 15 : 355 - 376
[10] SCANNING-TRANSMISSION ELECTRON-MICROSCOPE AS AN ANALYTICAL INSTRUMENT
ISAACSON, M
JOM-JOURNAL OF METALS, 1976, 28 (12): : A18 - A18

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