Electrostatic electron microscopy. II

被引：6
|
作者：
Bachman, CH [1 ]
Ramo, S [1 ]
机构：
[1] Gen Elect Co, Elect Lab, Schenectady, NY USA
来源：
JOURNAL OF APPLIED PHYSICS | 1943年 / 14卷 / 02期
关键词：
D O I：
10.1063/1.1714953
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：69 / 77
页数：9
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