Electrostatic electron microscopy. II

被引：6

|

作者：

Bachman, CH ^{[1
]}

Ramo, S ^{[1
]}

机构：

[1] Gen Elect Co, Elect Lab, Schenectady, NY USA

来源：

JOURNAL OF APPLIED PHYSICS | 1943年 / 14卷 / 02期

关键词：

D O I：

10.1063/1.1714953

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：69 / 77

页数：9

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