COMPARISON OF A TIME-OF-FLIGHT SYSTEM WITH AN ELECTROSTATIC ANALYZER IN LOW-ENERGY ION SCATTERING

被引:37
|
作者
BUCK, TM
WHEATLEY, GH
MILLER, GL
ROBINSON, DAH
CHEN, YS
机构
来源
NUCLEAR INSTRUMENTS & METHODS | 1978年 / 149卷 / 1-3期
关键词
D O I
10.1016/0029-554X(78)90933-3
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:591 / 594
页数:4
相关论文
共 50 条
  • [41] H(-)-CONVERSION AIDED DETECTION OF LOW-ENERGY H-0 FLUXES FROM THE TORTUR TOKAMAK IN A TIME-OF-FLIGHT ANALYZER
    VANTOLEDO, W
    VANBUUREN, R
    DONNE, AJH
    DEKLUIVER, H
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (04): : 2223 - 2231
  • [42] A time-of-flight detector of low-energy ions for an accelerating mass-spectrometer
    Alinovskii, N. I.
    Konstantinov, E. S.
    Parkhomchuk, V. V.
    Petrozhitskii, A. V.
    Rastigeev, S. A.
    Reva, V. B.
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2009, 52 (02) : 234 - 237
  • [43] A time-of-flight detector of low-energy ions for an accelerating mass-spectrometer
    N. I. Alinovskii
    E. S. Konstantinov
    V. V. Parkhomchuk
    A. V. Petrozhitskii
    S. A. Rastigeev
    V. B. Reva
    Instruments and Experimental Techniques, 2009, 52 : 234 - 237
  • [44] Ion beam chopping method for low energy time-of-flight measurements
    Aratari, R.
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1988, B34 (04) : 493 - 498
  • [45] STOPPING POWER MEASUREMENTS FOR LOW-ENERGY IONS IN GASES BY TIME-OF-FLIGHT SPECTROSCOPY
    FREITAG, K
    RESCHKE, D
    GEYER, E
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 27 (02): : 344 - 352
  • [46] TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF INSULATORS WITH PULSED CHARGE COMPENSATION BY LOW-ENERGY ELECTRONS
    HAGENHOFF, B
    VANLEYEN, D
    NIEHUIS, E
    BENNINGHOVEN, A
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (05): : 3056 - 3064
  • [47] Low-energy Rutherford backscattering-ion channeling measurement system with the use of several tens keV hydrogen and a time-of-flight spectrometer
    Hasegawa, M
    Kobayashi, N
    Hayashi, N
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (10): : 3510 - 3514
  • [48] ELECTROSTATIC ANALYZER AND OPTICS FOR LOW-ENERGY ELECTRON-SPECTROSCOPY
    BOUMSELLEK, S
    TUAN, VN
    ESAULOV, VA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (07): : 1854 - 1857
  • [49] Improved gating device of time-of-flight ion mass analyzer for ion sources
    Choe, Kyumin
    Kim, DongHwan
    Chung, Kyoung-Jae
    Hwang, Y. S.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2019, 90 (03):
  • [50] TIME-OF-FLIGHT ANALYZER FOR MEASUREMENTS OF ENERGY AND MASS SPECTRA OF PARTICLES
    SYSOEV, AA
    NIKOLAEV, BI
    SAMSONOV, GA
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1971, 14 (02): : 383 - &