CHARACTERIZATION OF MATERIALS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION

被引：0
|
作者：
TANAKA, M [1 ]
机构：
[1] TOHOKU UNIV,SCI MEAS RES INST,SENDAI,MIYAGI 980,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1990年 / 39卷 / 04期
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TH742 [显微镜];
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页码：293 / 293
页数：1
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