CHARACTERIZATION OF MATERIALS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION

被引：0

作者：

TANAKA, M ^{[1
]}

机构：

[1] TOHOKU UNIV,SCI MEAS RES INST,SENDAI,MIYAGI 980,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1990年 / 39卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：293 / 293

页数：1

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