THE RELIABILITY OF MAGNETRONS FOR MICROWAVE-OVENS

被引：0

作者：

KITAGAWA, K

KANUMA, Y

OGURO, T

HARADA, A

机构：

[1] Science Univ of Tokyo, Noda, Jpn, Science Univ of Tokyo, Noda, Jpn

来源：

关键词：

FAILURE MODE-EFFECT ANALYSIS (FMEA) - FAULT TREE ANALYSIS - MICROWAVE OVENS;

D O I：

10.1080/08327823.1986.11687989

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

(Edited Abstract)

引用

页码：149 / 158

页数：10

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