APPLICATION OF ELECTRON-BEAMS FOR HIGH HEAT-FLUX TESTS

被引：2
|
作者：
AKIBA, M
TANAKA, S
SEKI, M
机构：
来源：
JOURNAL OF THE ATOMIC ENERGY SOCIETY OF JAPAN | 1991年 / 33卷 / 05期
关键词：
D O I：
10.3327/jaesj.33.447
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
[No abstract available]
引用
收藏
页码：447 / 474
页数：28
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