APPLICATION OF ELECTRON-BEAMS FOR HIGH HEAT-FLUX TESTS

被引:2
|
作者
AKIBA, M
TANAKA, S
SEKI, M
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D O I
10.3327/jaesj.33.447
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
[No abstract available]
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页码:447 / 474
页数:28
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