ON 1/F NOISE AND RANDOM TELEGRAPH NOISE IN VERY SMALL ELECTRONIC DEVICES

被引：16
|
作者：
KLEINPENNING, TGM
机构：
[1] Eindhoven University of Technology, Eindhoven
来源：
PHYSICA B | 1990年 / 164卷 / 03期
关键词：
D O I：
10.1016/0921-4526(90)90820-K
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
We demonstrate that random telegraph signal (RTS) noise can only be observed in small electronic devices where the number of free charge carriers is smaller than 1 {α ln(f{hook}mτs}. Here α is the Hooge 1 f{hook} noise parameter, f{hook}m the bandwidth of the measuring system and τs the sum of the mean capture and emission time of the charge carriers. The current idea that 1 f{hook} noise in larger devices is the result of a superposition of RTS noise due to individual trapping is doubtful. © 1990.
引用
收藏
页码：331 / 334
页数：4
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