ELECTRICAL AND OPTICAL CHARACTERIZATION OF METASTABLE DEEP-LEVEL DEFECTS IN GAAS

被引：25
|
作者：
BUCHWALD, WR
GERARDI, GJ
POINDEXTER, EH
JOHNSON, NM
GRIMMEISS, HG
KEEBLE, DJ
机构：
[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
[2] UNIV LUND,DEPT SOLID STATE PHYS,S-22007 LUND 7,SWEDEN
[3] MICHIGAN TECHNOL UNIV,DEPT PHYS,HOUGHTON,MI 49931
来源：
PHYSICAL REVIEW B | 1989年 / 40卷 / 05期
关键词：
D O I：
10.1103/PhysRevB.40.2940
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：2940 / 2945
页数：6
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