ELECTRON DISPLACEMENT DAMAGE IN COPPER AND ALUMINIUM IN A HIGH VOLTAGE ELECTRON MICROSCOPE

被引：129

|

作者：

MAKIN, MJ

机构：

来源：

PHILOSOPHICAL MAGAZINE | 1968年 / 18卷 / 153期

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D O I：

10.1080/14786436808227466

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：637 / &

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