SIMPLE ANGLE-RESOLVED AUGER-ELECTRON SPECTROSCOPY SYSTEM - EFFECTIVE RULE FOR MEASUREMENT AND TESTS OF POSSIBILITIES

被引:6
|
作者
MROZ, A
MROZ, S
ZAGORSKI, M
机构
[1] Univ of Wroclaw, Poland
关键词
Electron Guns - Electron Optics - Electrons--Diffraction - Nickel and Alloys--Surfaces - Surfaces--Spectroscopic Analysis;
D O I
10.1002/sia.740120111
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
An angle-resolved Auger electron spectrometer, containing an immovable collector of electrons placed behind the hole in the fluorescent screen of the LEED optics and a electron gun fastened to the sample holder and rotating together with this sample was constructed and tested. Conditions enabling the best angular resolution, the effective rule for the measurement procedure with the use of microcomputer for controlling the measurement and storage and evaluation of the results, and a simple method of deconvolution of AES angles are proposed. A result of testing measurements of polar angle-resolved Auger electron spectroscopy (ARAES) profile for the nickel (001) face is presented.
引用
收藏
页码:49 / 52
页数:4
相关论文
共 50 条
  • [31] Photonic band measurement by angle-resolved spectroscopy and polarimetry
    Kral, Zdenek
    Ferre-Borrull, Josep
    Marsal, Lluis F.
    Pallares, Josep
    Garcia-Caurel, Enric
    Foldyna, Martin
    Olaizola, Santiago M.
    PROCEEDINGS OF THE 2009 SPANISH CONFERENCE ON ELECTRON DEVICES, 2009, : 394 - +
  • [32] A FAST AND SIMPLE METHOD FOR BACKGROUND REMOVAL IN AUGER-ELECTRON SPECTROSCOPY
    BAUER, HE
    FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1995, 353 (3-4): : 450 - 455
  • [33] A STUDY OF POLAR CDTE(111) SURFACES USING ANGLE-RESOLVED X-RAY PHOTOELECTRON AND AUGER-ELECTRON SPECTROSCOPY AND LOW-ENERGY ELECTRON-DIFFRACTION
    LU, YC
    FEIGELSON, RS
    ROUTE, RK
    JOURNAL OF APPLIED PHYSICS, 1990, 67 (05) : 2583 - 2590
  • [34] Angle-resolved resonant Auger electron spectroscopy of CO after vibrationally resolved C 1s → nlλ excitations
    Hemmers, O
    Heiser, F
    Viefhaus, J
    Wieliczek, K
    Becker, U
    JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1999, 32 (15) : 3769 - 3782
  • [35] A PRACTICAL DEPTH DISTRIBUTION FUNCTION FOR ANGLE-RESOLVED AUGER-PHOTOELECTRON SPECTROSCOPY
    DWYER, VM
    SURFACE SCIENCE, 1994, 310 (1-3) : L621 - L624
  • [36] STUDY OF SURFACE-COMPOSITION OF IRON-BASED METALLIC GLASSES BY MEANS OF UV PHOTOEMISSION, ANGLE-RESOLVED AUGER-ELECTRON AND ION-SCATTERING SPECTROSCOPY
    BERGHAUS, T
    NEDDERMEYER, H
    RADLIK, W
    ROGGE, V
    PHYSICA SCRIPTA, 1983, T4 : 194 - 196
  • [37] USE OF ANGLE RESOLVED AUGER-ELECTRON SPECTROSCOPY FOR SITE IDENTIFICATION OF SULFUR ADSORBED ON A CU-(100) SURFACE
    NOONAN, JR
    DAVIS, HL
    ZEHNER, DM
    JENKINS, LH
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (03): : 488 - 488
  • [38] ANGLE-RESOLVED L2,3VV AUGER-ELECTRON EMISSION FROM SULFUR ADSORBED ON A CU(100) SURFACE
    NOONAN, JR
    DAVIS, HL
    ZEHNER, DM
    JENKINS, LH
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1976, 21 (07): : 940 - 940
  • [39] Angle-resolved photoemission spectroscopy of a Fermi–Hubbard system
    Peter T. Brown
    Elmer Guardado-Sanchez
    Benjamin M. Spar
    Edwin W. Huang
    Thomas P. Devereaux
    Waseem S. Bakr
    Nature Physics, 2020, 16 : 26 - 31
  • [40] Tabletop system performs angle-resolved photoemission spectroscopy
    Koralek, J
    LASER FOCUS WORLD, 2006, 42 (02): : 11 - 11