SIMPLE ANGLE-RESOLVED AUGER-ELECTRON SPECTROSCOPY SYSTEM - EFFECTIVE RULE FOR MEASUREMENT AND TESTS OF POSSIBILITIES

被引：6
|
作者：
MROZ, A
MROZ, S
ZAGORSKI, M
机构：
[1] Univ of Wroclaw, Poland
来源：
SURFACE AND INTERFACE ANALYSIS | 1988年 / 12卷 / 1-12期
关键词：
Electron Guns - Electron Optics - Electrons--Diffraction - Nickel and Alloys--Surfaces - Surfaces--Spectroscopic Analysis;
D O I：
10.1002/sia.740120111
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
An angle-resolved Auger electron spectrometer, containing an immovable collector of electrons placed behind the hole in the fluorescent screen of the LEED optics and a electron gun fastened to the sample holder and rotating together with this sample was constructed and tested. Conditions enabling the best angular resolution, the effective rule for the measurement procedure with the use of microcomputer for controlling the measurement and storage and evaluation of the results, and a simple method of deconvolution of AES angles are proposed. A result of testing measurements of polar angle-resolved Auger electron spectroscopy (ARAES) profile for the nickel (001) face is presented.
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页码：49 / 52
页数：4
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