AVOIDING PHASE-MEASURING INTERFEROMETRY PITFALLS

被引:0
|
作者
KOLIOPOULOS, CL
机构
关键词
D O I
暂无
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:169 / 176
页数:8
相关论文
共 50 条
  • [21] MOIRE PHASE-MEASURING INTERFEROMETER FOR ASPHERIC MIRRORS
    PETERS, WN
    IVALDI, J
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (05) : 655 - &
  • [22] PHASE-MEASURING PROFILOMETRY USING SINUSOIDAL GRATING
    CHANG, M
    HO, CS
    EXPERIMENTAL MECHANICS, 1993, 33 (02) : 117 - 122
  • [23] New method of high precision for phase-measuring
    Gu, Pingbei
    Guangdian Gongcheng/Opto-Electronic Engineering, 1995, 22 (05): : 65 - 68
  • [24] A DIRECT MAPPING ALGORITHM FOR PHASE-MEASURING PROFILOMETRY
    ZHOU, WS
    SU, XY
    JOURNAL OF MODERN OPTICS, 1994, 41 (01) : 89 - 94
  • [25] ANALYTICAL PHASE-MEASURING TECHNIQUE FOR RETARDATION MEASUREMENTS
    NECHEV, GC
    APPLIED OPTICS, 1994, 33 (28): : 6621 - 6625
  • [26] Integrated calibration of multiview phase-measuring profilometry
    Lee, Yeong Beum
    Kim, Min H.
    OPTICS AND LASERS IN ENGINEERING, 2017, 98 : 118 - 122
  • [27] Phase-measuring profilometry in large scale measurement
    Sichuan Univ, Chengdu, China
    Guangxue Xuebao/Acta Optica Sinica, 2000, 20 (06): : 792 - 796
  • [28] Effects of phase change on reflection in phase-measuring interference microscopy
    Dubois, A
    APPLIED OPTICS, 2004, 43 (07) : 1503 - 1507
  • [29] Two-dimensional phase-measuring profilometry
    Zheng, RH
    Wang, YX
    Zhang, XR
    Song, YL
    APPLIED OPTICS, 2005, 44 (06) : 954 - 958
  • [30] Simple digital phase-measuring algorithm for low-noise heterodyne interferometry (vol 27, 085001, 2016)
    Kokuyama, Wataru
    Nozato, Hideaki
    Ota, Akihiro
    Hattori, Koichiro
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2021, 32 (10)