ELECTRICAL-PROPERTIES AND CONDUCTION MECHANISMS OF RUBASED THICK-FILM (CERMET) RESISTORS

被引：241

|

作者：

PIKE, GE

SEAGER, CH

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1977年 / 48卷 / 12期

关键词：

D O I：

10.1063/1.323595

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：5152 / 5169

页数：18

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