STARTING PRODUCTION OF HIGH-PRECISION MEASURING INSTRUMENTS IN KHARKOV PRIBOROREMONT PLANT

被引：0
|
作者：
NIKRITIN, PA
ASTRAKHA.AB
机构：
来源：
MEASUREMENT TECHNIQUES-USSR | 1968年 / 06期
关键词：
D O I：
暂无
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：830 / &
相关论文
共 50 条
  • [31] Aligning and measuring the curvature and thickness of high-precision lens
    Wu, Kun-Huan
    Chang, Shenq-Tsong
    Hsu, Ming-Ying
    Huang, Ting-Ming
    Hsu, Wei-Yao
    Tseng, Shih-Feng
    OPTOMECHANICAL ENGINEERING 2015, 2015, 9573
  • [32] Development of a High-Precision Multifunctional Probe for Measuring Microstructures
    Li, Rui-Jun
    Zheng, Jie
    Kang, Kai
    Cai, Xiao-Yu
    Wang, Biao
    Pan, Qiao-Sheng
    Fan, Kuang-Chao
    IEEE SENSORS JOURNAL, 2021, 21 (07) : 9112 - 9119
  • [33] IMPROVED HIGH-PRECISION MEASURING METHOD FOR BRIDGE CRANES
    GOESMANN, H
    STAHL UND EISEN, 1975, 95 (18): : 832 - 836
  • [34] CATALOG OF PRODUCTION SCHEDULES FOR HIGH-PRECISION SHAPES
    BATALOV, AG
    KRIVTSOVA, RD
    PLAKHOTIN, VS
    BUBNOV, EA
    MITIN, VI
    URALSKII, VI
    METALLURGIST, 1982, 26 (11-1) : 421 - 422
  • [35] Effective technology of high-precision section production
    Kaputkina, L.M.
    Trusov, V.A.
    Urusova, O.V.
    1600,
  • [36] EXPERIENCES IN HIGH-PRECISION MANUFACTURING - PRODUCTION TECHNIQUES
    不详
    MICROTECNIC, 1976, (04): : 4 - 4
  • [37] Clever systems for high-precision production monitoring
    Clevere systeme für hochgenaue fertigungsuberwachung
    1600, Verlag Stahleisen GmbH (137):
  • [38] HIGH-PRECISION PRODUCTION OF LENGTHS OF WIRE.
    Schweer, Wilhelm
    Braun, Winrich
    Wireworld international, 1986, 28 (9-10): : 152 - 154
  • [39] Instruments and methods with high-precision for wave velocity measurement on shale debris
    Suo Yu
    Ge Hong-kui
    Wang Xiao-qiong
    Meng Fan-bao
    Liu Jun-rong
    ROCK AND SOIL MECHANICS, 2018, 39 (01) : 385 - 392
  • [40] Measuring the span of stress asymmetries on high-precision matched devices
    Tuinhout, HP
    Bretveld, A
    Peters, WCM
    ICMTS 2004: PROCEEDINGS OF THE 2004 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, 2004, : 117 - 122
12345