INFLUENCE OF AN AFM TIP ON INTERFACIAL MELTING ON ICE

被引：13

作者：

EASTMAN, T ^{[1
]}

ZHU, DM ^{[1
]}

机构：

[1] UNIV MISSOURI,DEPT PHYS,KANSAS CITY,MO 64110

来源：

JOURNAL OF COLLOID AND INTERFACE SCIENCE | 1995年 / 172卷 / 02期

关键词：

ATOMIC FORCE MICROSCOPY; SURFACE MELTING; ICE; INTERFACIAL MELTING;

D O I：

10.1006/jcis.1995.1255

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Strong capillary forces between a tip in an atomic force microscope and a solid surface covered with a thin layer liquid him makes it possible to detect and study the interfacial melting phenomenon. We discuss the general characteristics of force-distance curves measured on a solid surface which undergoes interfacial melting. We estimate the thermal disturbance of interfacial melting from the laser beam reflection system which is utilized by many atomic force microscopes. (C) 1995 Academic Press, Inc.

引用

页码：297 / 301

页数：5

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