Flux dynamics and critical currents of high T-c tapes

被引：0

作者：

Rosseel, K. ^{[1
]}

Metlushko, V. ^{[1
]}

Boon, W. ^{[1
]}

Dierickx, D. ^{[2
]}

Moshchalkov, V. V. ^{[1
]}

Bruynseraede, Y. ^{[1
]}

Van der Biest, O. ^{[2
]}

Liu, R. S. ^{[3
]}

机构：

[1] Katholieke Univ Leuven, Lab Vaste Stoffysica & Magnetisme, B-3001 Louvain, Belgium

[2] Katholieke Univ Leuven, Dept Met & Toegepaste Mat, B-3001 Louvain, Belgium

[3] Ind Technol Res Inst, Mat Res Labs, Hsinchu 31015, Taiwan

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1994年 / 235-40卷

关键词：

D O I：

10.1016/0921-4534(94)91235-1

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on detailed measurements of the temperature and field variation of the critical current density J(c)(T, H) and normalised relaxation rate S = d (In M)/d(In t) in (Bi, Pb)(2)Sr2Ca2Cu3Ox (T-c = 110 K) and (TI,Pb,Bi)(Sr,Ba)(2)Cu3Ox (T-c approximate to 119 K) silver-sheeted tapes with a critical current density J(c)(T=5K, H=0T)approximate to 10(5) A / cm(2). For these tapes two different pinning regimes at T < 20 K and T > 20 K have been found and characterised by the change of the slope in J(c)(T-Cr approximate to 20 K). This anomaly is clearly observed in the wide field interval H <= 30kG. Comparison of J(c)(T) and normalised relaxation rate S demonstrates that these materials are an intermediate case between single crystals and thin films.

引用

页码：3417 / 3418

页数：2

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