Flux dynamics and critical currents of high T-c tapes

被引:0
|
作者
Rosseel, K. [1 ]
Metlushko, V. [1 ]
Boon, W. [1 ]
Dierickx, D. [2 ]
Moshchalkov, V. V. [1 ]
Bruynseraede, Y. [1 ]
Van der Biest, O. [2 ]
Liu, R. S. [3 ]
机构
[1] Katholieke Univ Leuven, Lab Vaste Stoffysica & Magnetisme, B-3001 Louvain, Belgium
[2] Katholieke Univ Leuven, Dept Met & Toegepaste Mat, B-3001 Louvain, Belgium
[3] Ind Technol Res Inst, Mat Res Labs, Hsinchu 31015, Taiwan
关键词
D O I
10.1016/0921-4534(94)91235-1
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on detailed measurements of the temperature and field variation of the critical current density J(c)(T, H) and normalised relaxation rate S = d (In M)/d(In t) in (Bi, Pb)(2)Sr2Ca2Cu3Ox (T-c = 110 K) and (TI,Pb,Bi)(Sr,Ba)(2)Cu3Ox (T-c approximate to 119 K) silver-sheeted tapes with a critical current density J(c)(T=5K, H=0T)approximate to 10(5) A / cm(2). For these tapes two different pinning regimes at T < 20 K and T > 20 K have been found and characterised by the change of the slope in J(c)(T-Cr approximate to 20 K). This anomaly is clearly observed in the wide field interval H <= 30kG. Comparison of J(c)(T) and normalised relaxation rate S demonstrates that these materials are an intermediate case between single crystals and thin films.
引用
收藏
页码:3417 / 3418
页数:2
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