STATISTICAL INTEGRATED-CIRCUIT DESIGN

被引：53

作者：

DIRECTOR, SW ^{[1
]}

FELDMANN, P ^{[1
]}

KRISHNA, K ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1993年 / 28卷 / 03期

关键词：

D O I：

10.1109/4.209985

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

IC manufacturers have become increasingly interested in maximizing yield as a way to maximize profits. As a result, there has recently been renewed interest in computer aids for maximizing yield. While statistical design methods for maximizing circuit yield have been available for more than two decades, it is only recently that such methods have become practical. In this paper, we review some of these methods and illustrate the usefulness of one of these, the boundary integral method, with several examples.

引用

页码：193 / 202

页数：10

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