3-DIMENSIONAL WAVE-FRONT IMAGING BY NEAR-FIELD SCANNING OPTICAL MICROSCOPY

被引：8
|
作者：
LEVY, J
COHEN, A
AWSCHALOM, DD
机构：
[1] Department of Physics, University of California, Santa Barbara
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 05期
关键词：
D O I：
10.1063/1.1145512
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We have designed a near-field scanning optical microscope head compatible with an existing commercial scanning probe system. Near-field images of coherent scattering from a 500 nm fused silica grating are collected in transmission mode as a function of tip-sample separation, wavelength, and incident polarization. The images are compared with numerical simulations of scattering using both scalar wave and vector dipole approximations. The simulations suggest that the procedure can be inverted, allowing one to measure the dielectric constant ε(x,y,z) of an embedded three-dimensional object using information obtained in the near field. © 1995 American Institute of Physics.
引用
收藏
页码：3385 / 3387
页数：3
相关论文
共 50 条
  • [31] Femtosecond near-field scanning optical microscopy
    Nechay, BA
    Siegner, U
    Achermann, M
    Morier-Genaud, F
    Schertel, A
    Keller, U
    JOURNAL OF MICROSCOPY-OXFORD, 1999, 194 : 329 - 334
  • [32] Contact scanning near-field optical microscopy
    Lapshin, DA
    Sekatskii, SK
    Letokhov, VS
    Reshetov, VN
    JETP LETTERS, 1998, 67 (04) : 263 - 268
  • [33] Near-field scanning optical microscopy and polymers
    Rucker, M
    DeSchryver, FC
    Vanoppen, P
    Jeuris, K
    DeFeyter, S
    Hotta, J
    Masuhara, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 131 (1-4): : 30 - 37
  • [34] Near-field scanning optical microscopy of nanostructures
    Department of Chemistry, University of California, Santa Barbara, CA 93106-9510, United States
    Phase Transitions, 1 (27-57):
  • [35] SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM)
    POHL, DW
    FISCHER, UC
    DURIG, UT
    JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 853 - 861
  • [36] Differential near-field scanning optical microscopy
    Ozcan, Aydogan
    Cubukcu, Ertugrul
    Bilenca, Alberto
    Crozier, Kenneth B.
    Bouma, Brett E.
    Capasso, Federico
    Tearney, Guillermo J.
    NANO LETTERS, 2006, 6 (11) : 2609 - 2616
  • [37] Contact scanning near-field optical microscopy
    Lapshin, D.A.
    Reshetov, V.N.
    Sekatskii, S.K.
    Letokhov, V.S.
    JETP Letters (Translation of Pis'ma v Zhurnal Eksperimental'noi Teoreticheskoi Fiziki), 1998, 67 (04):
  • [38] Applications of near-field scanning optical microscopy
    Hess, HF
    Betzig, E
    SEMICONDUCTOR CHARACTERIZATION: PRESENT STATUS AND FUTURE NEEDS, 1996, : 395 - 398
  • [39] Photoreflectance Near-field Scanning Optical Microscopy
    Paulson, C
    Hawkins, B
    Sun, JX
    Ellis, AB
    McCaughan, L
    Kuech, TF
    OPTICAL MICROSTRUCTURAL CHARACTERIZATION OF SEMICONDUCTORS, 2000, 588 : 13 - 17
  • [40] Near-field scanning optical microscopy of nanostructures
    DeAro, JA
    Weston, KD
    Buratto, SK
    PHASE TRANSITIONS, 1999, 68 (01) : 27 - 57
12345