NEW METHOD OF CALCULATING BULK AND SURFACE STATES IN THIN-FILMS

被引:53
|
作者
ALLDREDG.GP
KLEINMAN, L
机构
关键词
D O I
10.1103/PhysRevLett.28.1264
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1264 / &
相关论文
共 50 条
  • [21] SIMPLE SEMIEMPIRICAL METHOD OF CALCULATING VANDERWAALS INTERACTIONS IN THIN-FILMS FROM LIFSHITZ THEORY
    VASSILIEFF, CS
    IVANOV, IB
    ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1976, 31 (12): : 1584 - 1588
  • [22] METHOD FOR CALCULATING SURFACE STATES
    FOO, EN
    THORPE, MF
    WEAIRE, DL
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1975, 20 (03): : 325 - 325
  • [23] SYMMETRICAL SUPERCONDUCTING STATES IN THIN-FILMS
    SHENG, W
    YANG, YS
    SIAM JOURNAL ON APPLIED MATHEMATICS, 1992, 52 (03) : 614 - 629
  • [25] NEW METHOD FOR DETERMINING THE NONLINEAR OPTICAL COEFFICIENTS OF THIN-FILMS
    HASE, Y
    KUMATA, K
    KANO, SS
    OHASHI, M
    KONDO, T
    ITO, R
    SHIRAKI, Y
    APPLIED PHYSICS LETTERS, 1992, 61 (02) : 145 - 146
  • [26] A NEW METHOD FOR THE DETERMINATION OF THE OPTICAL-CONSTANTS OF THIN-FILMS
    STICHAUER, L
    GAVOILLE, G
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1992, 133 (02): : 547 - 553
  • [27] New device and method for measuring thermal conductivity of thin-films
    Subramanian, CS
    Amer, T
    UpChurch, BT
    Alderfer, DW
    Burkett, C
    Sealey, B
    ISA TRANSACTIONS, 2006, 45 (03) : 313 - 318
  • [28] NEW METHOD FOR DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILMS
    WU, MH
    FARHAT, NH
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1975, 65 (10) : 1195 - 1195
  • [29] SURFACE ANALYSIS OF THIN-FILMS - SURVEY
    POLASCHEGG, HD
    VAKUUM-TECHNIK, 1979, 28 (01): : 12 - 17
  • [30] UMKLAPP SURFACE REFLECTION IN THIN-FILMS
    MORE, RM
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1974, 19 (03): : 325 - 325