NEW METHOD OF CALCULATING BULK AND SURFACE STATES IN THIN-FILMS

被引：53
|
作者：
ALLDREDG.GP
KLEINMAN, L
机构：
来源：
PHYSICAL REVIEW LETTERS | 1972年 / 28卷 / 19期
关键词：
D O I：
10.1103/PhysRevLett.28.1264
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：1264 / &
相关论文
共 50 条
  • [1] A DIATOMIC NETWORK MODEL FOR ELECTRONIC STATES OF BULK, SURFACE AND THIN-FILMS
    WU, CH
    LEE, FT
    JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1985, 46 (11) : 1255 - 1265
  • [2] METHOD FOR CALCULATING INDEX OF REFRACTION OF THIN-FILMS
    WOHLGEMUTH, JH
    BRODIE, DE
    CANADIAN JOURNAL OF PHYSICS, 1975, 53 (18) : 1737 - 1742
  • [3] THE BULK AND SURFACE-STRUCTURES OF THIN-FILMS OF ANTIMONY
    STIDDARD, MHB
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1985, 4 (06) : 733 - 736
  • [4] VIRTUAL SURFACE-STATES OF THIN-FILMS
    JERRARD, RJ
    UEBA, H
    DAVISON, SG
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1981, 103 (01): : 353 - 359
  • [5] INVESTIGATION OF SURFACE ELECTRONIC STATES IN ZNSE THIN-FILMS
    DAVYDOV, IA
    SERIOGIN, VT
    STRAKHOV, LP
    TSELISHCHEV, SL
    VESTNIK LENINGRADSKOGO UNIVERSITETA SERIYA FIZIKA KHIMIYA, 1986, (03): : 32 - 37
  • [6] A NEW LASER METHOD FOR MAKING THIN-FILMS
    LYTLE, D
    PHOTONICS SPECTRA, 1993, 27 (01) : 136 - &
  • [7] A NEW METHOD FOR TENSILE TESTING OF THIN-FILMS
    RUUD, JA
    JOSELL, D
    SPAEPEN, F
    GREER, AL
    JOURNAL OF MATERIALS RESEARCH, 1993, 8 (01) : 112 - 117
  • [8] NEW METHOD FOR MEASURING PERMITTIVITY OF THIN-FILMS
    BEDNARCZYK, J
    PIECH, T
    PISARKIEWICZ, T
    WEGRZYN, A
    ACTA PHYSICA POLONICA A, 1975, A 47 (02) : 171 - 175
  • [9] SURFACE AND BULK CONDUCTIVITY MEASUREMENTS ON AMORPHOUS-SILICON THIN-FILMS
    AIDA, MS
    BOUDJAADAR, S
    CHARI, A
    MAHDJOUBI, L
    THIN SOLID FILMS, 1992, 207 (1-2) : 1 - 3
  • [10] NEW APPROACH TO CALCULATION OF TIGHT-BINDING SURFACE DENSITY OF STATES IN THIN-FILMS
    LAKS, B
    SALZBERG, JB
    SOLID STATE COMMUNICATIONS, 1977, 22 (07) : 417 - 420
12345