THE SECONDARY-EMISSION ELECTRON MULTIPLIER TUBE USED ON A MASS SPECTROMETER AND ITS AMPLIFICATION OF ION CURRENTS

被引：2

|

作者：

SUGIURA, T

机构：

来源：

BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN | 1962年 / 35卷 / 08期

关键词：

D O I：

10.1246/bcsj.35.1257

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

收藏

页码：1257 / 1262

页数：6

相关论文

共 47 条

[1] A SECONDARY-EMISSION ELECTRON MULTIPLIER TUBE FOR THE DETECTION OF HIGH ENERGY PARTICLES
STONE, RP
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1949, 20 (12): : 935 - 941
[2] SECONDARY-EMISSION MASS-SPECTROMETER
KELNER, L
LUNDQUIST, TR
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1983, 46 (JAN) : 27 - 30
[3] SECONDARY-EMISSION MASS-SPECTROMETER - APPLICATION AND EVALUATION
KELNER, L
MARKEY, SP
FALES, HM
LUNDQUIST, TR
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1984, 62 (03): : 237 - 251
[4] ION-BOMBARDMENT OF INSULATORS - DETERMINATION OF TARGET CURRENTS - SECONDARY-EMISSION
PRIMAK, W
[J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1974, 19 (01): : 31 - 31
[5] INFLUENCE OF ELECTRON BOMBARDMENT AND ANNEALING CYCLES ON SECONDARY EMISSION OF LEAD GLASSES USED IN MULTIPLIER TUBE
STEINER, K
HAFNER, P
BAUMGART.W
[J]. ZEITSCHRIFT FUR ANGEWANDTE MATHEMATIK UND PHYSIK, 1971, 22 (04): : 789 - &
[6] SURFACE ANALYSIS OF ION-IMPLANTATION BY SECONDARY-EMISSION MASS SPECTROGRAPH
HERNANDEZ, R
VIDAL, G
LANUSSE, P
SLODZIAN, G
[J]. MEMOIRES SCIENTIFIQUES DE LA REVUE DE METALLURGIE, 1973, 70 (01): : 47 - 52
[7] RECORDING ION CURRENTS IN THE MKH1304 MASS-SPECTROMETER WITH VEU-6 CHANNEL ELECTRON MULTIPLIER
KUZMICHEV, AI
AGAFONOV, IL
KUZMICHEV, SI
[J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1980, 23 (05) : 1236 - 1238
[8] SECONDARY-ELECTRON MULTIPLIER FOR MI-1305 MASS-SPECTROMETER
USTINOV, VG
SHVACHKO, VI
[J]. PRIBORY I TEKHNIKA EKSPERIMENTA, 1972, (01): : 236 - &
[9] Graphite-carbon cloth used as the substrate of a target in secondary-emission mass spectrometry
Karachevtsev, GV
Pronchev, GB
[J]. INDUSTRIAL LABORATORY, 2000, 66 (02): : 90 - 91
[10] Secondary ion emission enhancement assisted by electron beam in secondary ion mass spectrometry
Lee, Wei-Chiang
Hwang, J.
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 2008, 274 (1-3) : 25 - 29

← 1 2 3 4 5 →